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~institution:"Deutsches Institut für Wirtschaftsforschung"
~person:"Schäfer, Christin"
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Schäfer, Christin
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Automatic identification of faked and fraudulent interviews in surveys by two different methods
Schäfer, Christin
;
Schräpler, Jörg-Peter
;
Müller, …
-
2004
-
[Elektronische Ressource]
than could be expected from the whole
survey
. We focus on fabricated data, which were taken out of the
survey
before the …
Persistent link: https://www.econbiz.de/10002243139
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