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~isPartOf:"Economics letters"
~person:"Shin, Dong-wan"
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Shin, Dong-wan
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1
A Lagrangian multiplier test for market microstructure noise with applications to sampling interval determination for realized volatilities
Shin, Dong-wan
;
Hwang, Eunju
- In:
Economics letters
129
(
2015
),
pp. 95-99
Persistent link: https://www.econbiz.de/10011422016
Saved in:
2
Efficient realized variance, regression coefficient, and correlation coefficient under different sampling frequencies
Shin, Dong-wan
;
Park, Sangun
- In:
Economics letters
115
(
2012
)
3
,
pp. 334-337
Persistent link: https://www.econbiz.de/10009631616
Saved in:
3
Tests for asymmetry in possibly nonstationary dynamic panel models
Shin, Dong-wan
;
Jhee, Won-Chul
- In:
Economics letters
91
(
2006
)
1
,
pp. 15-20
Persistent link: https://www.econbiz.de/10003314911
Saved in:
4
Comparison of panel unit root tests under cross sectional dependence
Jang, Myoung Jin
;
Shin, Dong-wan
- In:
Economics letters
89
(
2005
)
1
,
pp. 12-17
Persistent link: https://www.econbiz.de/10003114692
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